The ETS Test Collection describes over 20,000 tests which reside in the library of the Educational Testing Service.
Tests in Microfiche is a subset of the entire ETS Test Collection. It includes non-commercial research instruments which the authors have agreed to make available through Educational Testing Service. These tests are on microfiche and can be reproduced for educational or research purposes. Most of this microfiche set is available in Current Periodicals & Microforms, Ekstrom Library (2nd floor – call no. 21 LB 23), and the fiche are grouped by a letter and filed by number within the letter grouping.
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An alternate for locating the tests is to use the paper index to the set, also in the Current Periodicals and Microfilm.
Template | Test Collection |
---|---|
System key | aiwd |
Call number | TC009428 |
Purchase | Email library@ets.org or Phone 1-609-734-5689 |
Title | Parental Attitudes Toward Mentally Retarded Children Scale. |
Author | Love, Harold D. |
Availability | Tests in Microfiche; Test Collection, Educational Testing Service, Princeton, NJ 08541 |
Year | 1967 |
Test Acronyms | TIM(F) |
Code | 8206 |
Major Descriptor | Children |
Major Descriptor | Mental Retardation |
Major Descriptor | Parent Attitudes |
Major Descriptor | Rating Scales |
Minor Descriptor | Adults |
Minor Descriptor | Attitude Measures |
Minor Descriptor | Likert Scales |
Minor Descriptor | Parents |
Abstract | This untimed Likert scale measures parental attitudes toward mentally retarded children in work, community, and school situations. |
General notes | ITEMS: 30. |
C. A. Bulletin | |
-Period | n/a |
-Year | 0 |
Security Level | 0 |
Multi-volume? | No |